NIST Database Upgrades

Description(s): The National Institute Of Standards And Technology (NIST) Intends To Negotiate, On a sole source basis under the authority of FAR 13.106(1)(b) , with the Technische Universitat Wien, Vienna, AUT. on continuing services for the following: Improvements to the NIST Database (SRD 100) for the simulation of electron spectra for surface analysis (SESSA),1) Development of a concept of changes required to allow a user to apply SESSA to nanostructured surfaces, and submission of a report describing the needed changes. 2) Incorporation of a database of non-dipolar asymmetry parameters for photoelectron emission into SESSA, modification of the software to permit retrieval and display of these data and for spectrum modeling, and delivery of a new version of SESSA with these changes (SESSA Version 1.3) Prof. Werner's expertise is in the quantitative application of Auger-electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS), the two most commonly used techniques of surface analysis. He is also the designer and principal author of SESSA. SESSA contains extensive physical data that is needed for quantitative applications of AES and XPS. SESSA also has software for the simulation of AES and XPS spectra to allow users to design experiments and to obtain more quantitative information from their AES and XPS results through comparisons of simulated and measured spectra. It is determined that NIST negotiate only with Prof. Werner because of his expertise in AES and XPS and because of his familiarity with the design structure and software code of the SESSA database.